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Studies on the microstructure, optical and electrical properties of organic microcavity devices based on a porous silicon reflector

机译:基于多孔硅反射镜的有机微腔器件的微观结构,光电性能的研究

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A novel type of microcavity organic light-emitting diode based on a porous silicon distributed Bragg reflector (PS-DBR) has first been achieved and its microstructure, optical, and electrical properties have also been investigated in detail. The microcavity is made up of the central active organic multilayer sandwiched between a top silver film and a bottom PS-DBR, formed by electrochemical etching of p~(++)-Si substrate. The field-emission scanning electron microscopy cross-section images show the nanometer-scale layered structure and flat interfaces inside the microcavity. The reflectivity (relative to an Al mirror) of the PS-DBR is up to 99 percent, and the stopband is about 160 nm wide. Resonant cavity mode appears as a tip in the reflectivity spectrum of the Si-based organic multilayer films, which is a symbol that the Si-based organic multilayer structure is indeed a microcavity. The peak widths of the electroluminescence (EL) spectra from the cavities emitting green and red light are greatly reduced from 85 nm and 70 nm to 8 nm and 12 nm, respectively, as compared with those measured from non-cavity structures. Note that the EL emission from the cavity devices is single-mode, and the off-resonant optical modes are highly suppressed. Moreover, increases of a factor of about 6 and 4 of the resonant peak intensity from the cavities emitting green and red light are also observed, respectively. In addition, the current-brightness-voltage characteristics and effect parameters on the lifetime of the cavity devices are also discussed. The present technique for obtaining enhanced EL emission from Si-based organic microcavity may also be another novel effective method for realizing Si-based optoelectronics device integration.
机译:首先获得了一种新型的基于多孔硅分布布拉格反射器(PS-DBR)的微腔有机发光二极管,并且已经对其微观结构,光学和电学性质进行了详细研究。微腔由夹在顶部银膜和底部PS-DBR之间的中心活性有机多层组成,该多层有机层是通过p〜(++)-Si基板的电化学蚀刻形成的。场发射扫描电子显微镜横截面图像显示了微腔内部的纳米级分层结构和平坦界面。 PS-DBR的反射率(相对于Al镜)高达99%,阻带宽约160 nm。共振腔模式在Si基有机多层膜的反射光谱中显示为尖端,这表明Si基有机多层结构确实是微腔。与从非腔结构测得的相比,来自发射绿光和红光的腔的电致发光(EL)光谱的峰宽分别从85 nm和70 nm分别减小到8 nm和12 nm。注意,来自腔器件的EL发射是单模的,并且非共振光学模被高度抑制。此外,还分别观察到来自发出绿光和红光的腔的共振峰值强度的大约6倍和4倍的增加。此外,还讨论了电流-亮度-电压特性以及对腔器件寿命的影响参数。用于从基于硅的有机微腔获得增强的EL发射的本技术也可以是用于实现基于硅的光电器件集成的另一种新颖的有效方法。

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