Patent Application Titled 'Mirror System and Method for Acquiring Biometric Data' Under Review

摘要

2012 OCT 15 (VerticalNews) -- By a News Reporter-Staff News Editor at Robotics & Machine Learning --nAccording to news reporting originating from Washington, D.C., by VerticalNews journalists, a patentnapplication by the inventors HANNA, Keith J. (New York, NY); Riddle, George Herbert Needhamn(Princeton, NJ); Hirvonen, David James (Brooklyn, NY); Sliney, David Hammond (Fallston, MD), filed onnJune 11, 2012, was cleared for further review on October 4, 2012.