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High sensitivity or streak mode interferometer for pulsed plasma diagnostics

机译:高灵敏度或条纹模式干涉仪,用于脉冲等离子体诊断

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A Michelson interferometer using a 5‐mW He–Ne laser can either be used in a photodiode detector mode to resolve transient fringe shifts ≲10-4 fringe or in a streak mode to obtain entire nanosecond resolved density profiles in a single shot. Extreme sensitivity is achieved by avoiding most noise sources. The effects of plasma light and of ray deflection due to density gradients are compensated for by the use of a lens, stop, and filter combination. Vibration induced signals are nearly eliminated by the use of feedback stabilization. A differential light detector system which subtracts signals at opposite sides of a fringe protects against laser noise and other spurious signals while doubling the sensitivity. In the streak mode a cylindrical lens beam expander allows utilization of nearly all of the laser light.
机译:使用5mW He–Ne激光器的迈克尔逊干涉仪既可以在光电二极管检测器模式下使用,以解决≲10-4条纹的瞬态条纹偏移,也可以在条纹模式下单次获得完整的纳秒分辨率密度分布。通过避免大多数噪声源来实现极高的灵敏度。通过使用透镜,光阑和滤光片组合,可以补偿由于密度梯度引起的等离子光和射线偏转的影响。通过使用反馈稳定化,几乎消除了由振动引起的信号。差分光检测器系统可以减去条纹相对两侧的信号,从而可以防止激光噪声和其他杂散信号,同时使灵敏度加倍。在条纹模式下,圆柱透镜扩束器允许几乎所有激光的利用。

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