...
首页> 外文期刊>Review of Scientific Instruments >Time-resolved ion energy distribution measurements using an advanced neutral particle analyzer on the MST reversed-field pinch
【24h】

Time-resolved ion energy distribution measurements using an advanced neutral particle analyzer on the MST reversed-field pinch

机译:使用先进的中性粒子分析仪在MST反向场夹点上进行时间分辨的离子能量分布测量

获取原文
获取原文并翻译 | 示例
           

摘要

An advanced neutral particle analyzer (ANPA) capable of simultaneously measuring hydrogen and deuterium ions of energies up to 45 keV has recently been developed for use on the Madison Symmetric Torus. The charge-to-mass separation allows for separate analysis of bulk deuterium ions and hydrogen ions injected with a 1 MW, 25 keV neutral beam. Orientation of the ANPA allows sampling of different regions of ion velocity space; a radial viewport favors collection of ions with high v⊥/|v| while a recently installed tangential viewport favors ions with high v||/|v|, such as those from the core-localized fast ion population created by the neutral beam. Signals are observed in the ANPA's highest energy channels during periodic magnetic reconnection events, which are drivers of anisotropic, non-Maxwellian ion energization in the reversed-field pinch. ANPA signal strength is dependent on the background neutral density, which also increases during magnetic reconnection events, so careful analysis must be performed to identify the true change in the ion distribution. A Monte Carlo neutral particle tracing code (NENE) is used to reconstruct neutral density profiles based on Dα line emission, which is measured using a 16-chord filtered photodiode array.
机译:最近已开发出一种先进的中性粒子分析仪(ANPA),它能够同时测量能量高达45 keV的氢和氘离子,用于Madison Symmetric Torus。电荷质量分离允许对注入1 MW,25 keV中性束的氘离子和氢离子进行单独分析。 ANPA的方向允许对离子速度空间的不同区域进行采样;径向视口有利于收集具有高v⊥/ | v |的离子而最近安装的切向视口则倾向于使用具有高v || / | v |的离子,例如来自由中性束产生的位于核心的快速离子种群的离子。在周期性的磁重连接事件期间,在ANPA的最高能量通道中观察到信号,这些信号是反向场收缩中各向异性的非麦克斯韦离子激发的驱动力。 ANPA信号强度取决于背景中性密度,背景中性密度在磁重新连接事件中也会增加,因此必须执行仔细的分析以识别离子分布的真实变化。蒙特卡洛中性粒子跟踪码(NENE)用于基于Dα线发射重建中性密度分布,该发射使用16弦滤波光电二极管阵列进行测量。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号