INTRINSIC QUALITY FACTOR OF ELECTROMAGNETIC OSCILLATIONS IN HALF-OPEN WAVEGUIDE JUNCTIONS WITH DIELECTRIC

摘要

This paper is an extension of a series of works devoted to inquiries in physics of resonant phenomena in waveguide junctions of different cross-section and to their usage for measurement of electric characteristics of materials. The work includes electrodynamic and numerical analysis of intrinsic Q-factors of H-type electromagnetic oscillation (having the largest Q value) in a cylindrical-rectangular waveguide junction filled with dielectric. The comparative characteristic of intrinsic Q-factors of waveguide junctions of different cross-sections is given — cylindrical-radial, rectangular-rectangular, and cylindrical-rectangular waveguides. Also, the paper contains recommendations on proper selection of waveguide junctions for measurement of dielectric loss of certain materials.