Hyper-Random Parameters of Reliability Devices of the Radioelectronic Equipment

摘要

There are considered the probability characteristic of parameters of reliability radio electronic equipment (REE), determined on a basis DM- and DN-distributions of a time between failures. Due to uncertainty of limits for factor of a variation of destruction processes, together with for a resource REE, all parameters of reliability are necessary for representing as hyper-random function. There are also offered approximation of the formula for definition of the basic parameters of reliability of electronic components REE.