Statistical Process Control for Real-World Applications

摘要

The purpose of this book is to show quality engineers and industrial statisticians how to apply statistical process control (SPC) techniques to situations in which the data is not normally distributed. The book has seven chapters, which cover traditional control charts, non-normal distributions, range charts for non-normal distributions, nested normal distributions, P_(pk) measurements, gauge capability and multivariate systems. The book gives detailed explanations, complete with maximum likelihood derivations, of how to go about deriving control limits for mean and range charts for the gamma, Weibull and lognormal distributions. That said, the procedure could be used for any distribution. This is done for both MS Excel and MathCAD functions. There is also a CD-ROM with programs to assist implementing procedures. In addition, there are exercises given with solu- tions at the end of each chapter for those who want to use the book for self-study.