SMALL CHANGES Big Results

摘要

THE HIGHLY ACCELERATED stress screen (HASS) is a standard industry process used to precipitate and detect a product's early-life defects. HASS is not designed, however, to capture all defects. In fact, a well-constructed HASS profile has a limited probability, varying by failure mode in its ability to capture product defects.1 Increased stresses caused when trying to precipitate harder-to-reach failure modes can lead to damage.