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摘要

Conformal Coating Evaluation for Use in Harsh Environments Utilizing a Modified Sir Test Protocol Author: Casey H. Cooper;ccooper@stielectron-icsinc.com. Abstract: The deadly combination of moisture (humidity), electrical potential (voltage bias), and ionic contamination (residue) is enough to create electrochemical failures such as dielectric failure and current leakage - both of which result in degradation in performance, if not complete failure, of the electronics hardware. The surface insulation resistance (SIR) test is a common standard used to evaluate effects of assembly materials and manufacturing processes (I.e., residual materials) for hardware operating in hot, humid environments. Although many test specifications and protocols exist, a more aggressive test protocol is required for high-reliability electronics to determine if the materials and processes used to manufacture the assembly will result in current leakage or dielectric breakdown between conductors.