An embodiment of the invention relates to an apparatus including a power semiconductor device and a processor coupled thereto. The processor is configured to provide a control signal to the power semiconductor device to regulate an output characteristic of the apparatus. The processor models an internal characteristic of the power semiconductor device and alters the control signal if the modeled internal characteristic crosses a threshold value. In an exemplary embodiment, the internal characteristic is a channel temperature of a MOSFET. A sensor such as a thermistor is coupled to or included within the processor to sense a parameter separate from the power semiconductor device, such as a processor temperature.
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