首页> 外文期刊>Powder Diffraction >X-ray powder diffraction data and structural study of Cd_4GeSe_6
【24h】

X-ray powder diffraction data and structural study of Cd_4GeSe_6

机译:X射线粉末衍射数据及Cd_4GeSe_6的结构研究

获取原文
获取原文并翻译 | 示例
       

摘要

The X-ray powder diffraction pattern of the room temperature phase of Cd_4GeSe_6, a Ⅱ_4 □ Ⅳ Ⅵ_6 semiconducting material, has been recorded and evaluated. This material crystallizes in the monoclinic space group Cc [No. 9] with a=12.84 (3), b=7.407 (2), c=12.854(2) A, β =109.82 (1)°, and Z=4. The powder diffraction pattern was also used to refine the crystal structure of this material employing the Rietveld method. The refinement of 56 parameters led to R_wp =13.2 /100, R_p=9.95/100 for 3751 step intensities and R_B=7.05/100 and R_F=5.20/100 for 833 reflections. Cd_4GeSe_6 can be considered a defect "adamantane-structure" material with a sphalerite-related Superstructure.
机译:记录并评估了Cd_4GeSe_6(一种Ⅱ_4□ⅣⅥ_6半导体材料)的室温相的X射线粉末衍射图。该物质在单斜空间群Cc [No. 9],其中a = 12.84(3),b = 7.407(2),c = 12.854(2)A,β= 109.82(1)°,Z = 4。粉末衍射图样还用于通过Rietveld方法细化该材料的晶体结构。 56个参数的细化导致R_wp = 13.2 /100、R_p=9.95/100(用于3751阶跃强度)以及R_B = 7.05 / 100和R_F = 5.20 / 100(用于833次反射)。 Cd_4GeSe_6可以看作是具有闪锌矿相关超结构的缺陷“金刚烷结构”材料。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号