Semiquantitative XRD analysis with the aid of reference intensity ratio estimates

摘要

Estimation of reference intensity ratios (k_i or RIR) can be made on the basis of an atomic scattering function. Tests of regression equations for 50 compounds that predict an approximate reference intensity ratio from the easily computed scattering function have shown usefulness in multicomponent semiquantitative X-ray diffraction analysis. The method is best applied whenever only one or two minor components of a multicomponent sample have no readily measurable or calculable k_i values and must be estimated.