X-ray powder diffraction data for indium nitride

摘要

X-ray powder diffraction pattern for InN synthesized using a microwave plasma source of nitrogen is reported. The data were obtained with the help of an automated Bragg-Brentano diffractometer using Ni-filtered cuKα radiation. The lattice parameters for the wurtzite-type unit cell are a_o =3.5378(1) a, c_o=5.7033(1) A. The calculated density is 6.921±0.002 g/cm~3.