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Full spectrum calculations of EDXRF spectra

机译:EDXRF光谱的全光谱计算

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Rapid and accurate methods are becoming available to calculate all of the relevant physical effects that contribute to an energy-dispersive X-ray fluorescence (EDXRF) spectrum, rather than just the characteristic line intensities given by the traditional fundamental parameters method. To evaluate the utility of such methods, we have calculated the full spectra of several compounds covering a wide range of compositions. The calculated spectra are compared directly with measured spectra. They include scattering of the X-ray tube lines and continuum, the Compton profile, and the detector response. Our results indicate that it is now possible to compute the full spectrum from an EDXRF system with very good accuracy.
机译:快速而准确的方法可用于计算有助于能量色散X射线荧光(EDXRF)光谱的所有相关物理效应,而不仅仅是传统基本参数方法给出的特征线强度。为了评估此类方法的实用性,我们计算了涵盖广泛组成的几种化合物的全光谱。将计算的光谱直接与测量的光谱进行比较。它们包括X射线管线和连续体的散射,康普顿轮廓和检测器响应。我们的结果表明,现在有可能以非常好的精度从EDXRF系统计算整个光谱。

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