Dislocations, crystallite size, and planar faults in nanocrystalline ceria

摘要

The modified Williamson-Hall and Warren-Averbach methods were used successfully for analyzing experimentally observed anisotropic X-ray diffraction line broadening and for determining reliable values of crystallite size and dislocation density in cerium oxide. The modified Williamson-Hall plot gives 22.3(2) nm for volume-weighted crystallite size, while the modified Warren-Averbach produces 18.0(2) nm for area-weighted grain size. The dislocation density and effective outer cut-off radius of dislocations obtained from the modified Warren-Averbach method are 1.8(3) ×10~(15) m~(-2) and 15.5(1) nm, respectively.