Sixty-first Denver X-ray Conference and selected papers for the special June Powder Diffraction issue

摘要

This issue of Powder Diffraction is comprised of selected papers presented at the 2012 61st annual Denver X-ray Conference (DXC). At DXC 13 workshops, two poster sessions, a plenary session New Frontiers in X-ray Analysis - Dedicated to the life and work of Robert L. Snyder, and 13 special sessions were held, covering the following topics:Cultural Heritage, Stress Analysis, Fusion and Industrial Applications of XRF, New Developments in XRD and XRF Instrumentation, Improved Fundamental Parameters, Rietveld Analysis, Industrial Applications and Energy Materials, Handheld XRF Applications, Trace Analysis, Line Profile Analysis, Quantitative Analysis, and Micro XRF.