首页> 外文期刊>Powder diffraction >Characterizing fundamental parameter-based analysis for soil-ceramic matrices in polarized energy-dispersive X-ray fluorescence (PEDXRF) spectrometry
【24h】

Characterizing fundamental parameter-based analysis for soil-ceramic matrices in polarized energy-dispersive X-ray fluorescence (PEDXRF) spectrometry

机译:极化能量色散X射线荧光(PEDXRF)光谱中表征基于基本参数的土壤-陶瓷基质分析

获取原文
获取原文并翻译 | 示例
       

摘要

Analytical polarized energy-dispersive X-ray fluorescence (PEDXRF) spectrometry (PEDXRFS) represents a substantial advancement over conventional XRF. The higher signal-to-noise commensurate with background lowering and better energy resolution, permits trace analysis for elements with Z≥ 11. Concomitantly, improvements in analytical software based on the fundamental parameters (FP) approach have improved accuracies and precisions for standard-less analysis (SLA). Two ceramic and soil standard reference materials (SRMs), 98a-Plastic Clay and GSS-1 powders, differed in their intrinsic matrix properties of grain size, bulk, and surface monolayer densities as well as the elemental concentrations. The SRMs were analyzed as powder and as pellets compacted under the same pressure conditions to double the bulk density. Different geometries represented by the sample cup (10, 15, and 24 mm) and pellet (10, 15, and 25 mm) diameters with the same sample thickness (with differing masses and aspect ratios), as well as (for powder samples only) identical low masses (0.5 g) but with varying thicknesses, were analyzed. PEDXRFS combined with TURBOQUANT~® (TQ) as SLA-FP enables good quantitative analysis for powders (Z≥ 13) even for masses significantly lower than recommended, for soil-ceramic samples. Pellets (Z≥ 12) yielded the best accuracy factor (AF) at high aspect ratio and thicknesses of the matrix analytical depth. Binder in pellets depreciates the AF. TQ needs to adequately quantitate matrix interferences effects, to improve accuracy in the analysis of low atomic numbers, e.g. Na and Mg.
机译:极化偏振能量色散X射线荧光(PEDXRF)光谱(PEDXRFS)代表了比常规XRF显着的进步。较高的信噪比与较低的本底噪声以及更好的能量分辨率相结合,可以对Z≥11的元素进行痕量分析。与此同时,基于基本参数(FP)方法的分析软件的改进提高了无标准品的准确性和精度。分析(SLA)。两种陶瓷和土壤标准参考材料(SRM),即98a-Plastic Clay和GSS-1粉末,其固有的基体性质(粒度,体积和表面单层密度以及元素浓度)不同。在相同的压力条件下将SRM分析为粉末和压片状,以使堆积密度增加一倍。以相同的样品厚度(质量和长宽比不同)以及(仅适用于粉末样品)样品杯(10、15和24毫米)和颗粒(10、15和25毫米)的直径表示不同的几何形状)分析了相同的轻质量(0.5 g),但厚度不同。 PEDXRFS与TURBOQUANT〜®(TQ)结合作为SLA-FP可以对粉末(Z≥13)进行良好的定量分析,即使质量明显低于推荐值,也适用于土壤陶瓷样品。粒料(Z≥12)在高纵横比和基质分析深度的厚度下产生了最佳的精度因子(AF)。颗粒中的粘合剂会降低AF。 TQ需要充分量化基质干扰效应,以提高分析低原子序数(例如原子序数)的准确性。钠和镁

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号