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Distribution analysis of functional groups in polymers by derivatization-electron probe X-ray microanalysis

机译:衍生化电子探针X射线显微分析聚合物中官能团的分布

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摘要

A new analytical method referred to as derivatization-electron probe X-ray microanalysis (XMA) has been developed to deter- mine the distribution of 0.1/100 order functional groups in polymers with pm level lateral resolution. The fundamental performance of XMA in analyzing derivatized polymers has been investigated. The results showed that the detection limit for the concentration of Br in a brominated epoxy resin was 0.05/100 and the lateral resolution was 3 μm. Also, the optimal reaction conditions that make it possible to derivatize selectively the vinyl groups, the carboxyl groups and the carbonyl groups have been found. These conditions are the key to this method. In addition, the depth profile of the vinyl groups in amine-degraded poly (vinyl chloride) has been analyzed using this method. Since the depth profiles agreed well with those obtained by micro-IR spectroscopy, the reliability of the distribution measurement of functional groups by this method was confirmed. By this method, the sensitivity was 30 times higher, and the lateral resolution was 4 times higher than those obtained by the micro-IR spectroscopy. The actual applications to the depth analysis of degraded Nylon-6 and ethylene-carbon monoxide copolymer have proved that this method is useful for the characterization of polymers and the study of polymer degradation.
机译:已经开发了一种称为衍生化电子探针X射线显微分析(XMA)的新分析方法,可确定侧向分辨率为pm的聚合物中0.1 / 100级官能团的分布。已经研究了XMA在分析衍生化聚合物中的基本性能。结果表明,溴化环氧树脂中的Br浓度检出限为0.05 / 100,横向分辨率为3μm。另外,已经找到了使乙烯基,羧基和羰基选择性衍生的最佳反应条件。这些条件是此方法的关键。另外,已经使用该方法分析了胺降解的聚(氯乙烯)中乙烯基的深度分布。由于深度轮廓与通过微红外光谱获得的轮廓吻合得很好,因此证实了通过该方法进行官能团分布测量的可靠性。通过这种方法,灵敏度比微红外光谱仪高30倍,横向分辨率高4倍。实际应用在降解的Nylon-6和乙烯-一氧化碳共聚物的深度分析中,已证明该方法可用于聚合物的表征和聚合物降解的研究。

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