首页> 外文期刊>Plasma Chemistry and Plasma Processing >Effect of Ion Energy on Structure and Composition of Cathodic Arc Deposited Alumina Thin Films
【24h】

Effect of Ion Energy on Structure and Composition of Cathodic Arc Deposited Alumina Thin Films

机译:离子能量对阴极电弧沉积氧化铝薄膜结构和成分的影响

获取原文
获取原文并翻译 | 示例
       

摘要

The effect of energy supplied to the growing alumina film on the composition and structure has been investigated by varying substrate temperature and substrate bias potential. The constitution and composition were studied by X-ray diffraction and elastic recoil detection analysis, respectively. Increasing the substrate bias potential from −50 to −100 V caused the amorphous or weakly crystalline films to evolve into stoichiometric, crystalline films with a mixture of the α- and γ-phase above 700 o C, and γ-phase dominated films at temperatures as low as 200 oC. All films had a grain size of <10 nm. The combined constitution and grain size data is consistent with previous work stating that γ-alumina is thermodynamically stable at grain sizes <12 nm [McHale et al., Science 277, 788 (1997)]. In order to correlate phase formation with synthesis conditions, the plasma chemistry and ion energy distributions were measured at synthesis conditions. These results indicate that for a substrate bias potential of −50 V, ion energies in excess of 100 eV are attained, both from a high energy tail and the accelerated ions with charge >1. These results are of importance for an increased understanding of the evolution of film composition and microstructure, also providing a pathway to γ-alumina growth at temperatures as low as 200 o C.
机译:通过改变衬底温度和衬底偏置电位,已经研究了提供给生长的氧化铝膜的能量对组成和结构的影响。通过X射线衍射和弹性反冲检测分析分别研究了其组成和组成。将衬底偏置电势从-50 V增加到-100 V会导致非晶或弱结晶膜演变为化学计量的,高于700 o C的α和γ相和γ相混合的结晶膜温度低至200 oC的薄膜。所有膜的晶粒尺寸均<10nm。组合的组成和晶粒度数据与先前的工作一致,后者指出γ-氧化铝在晶粒度小于12 nm时是热力学稳定的[McHale等人,Science 277,788(1997)]。为了使相形成与合成条件相关联,在合成条件下测量了等离子体化学和离子能分布。这些结果表明,对于-50 V的衬底偏置电势,无论是来自高能尾部还是电荷大于1的加速离子,都可以获得超过100 eV的离子能量。这些结果对于增进对膜组成和微观结构演变的理解非常重要,也为低至200℃的温度下γ-氧化铝的生长提供了途径。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号