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首页> 外文期刊>Physica status solidi >Effect of Field Annealing Induced Magnetic Anisotropy on the Performance of Meander-Core Orthogonal Fluxgate Sensor
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Effect of Field Annealing Induced Magnetic Anisotropy on the Performance of Meander-Core Orthogonal Fluxgate Sensor

机译:磁场退火引起的磁各向异性对弯芯正交磁通门传感器性能的影响

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摘要

The magnetic anisotropy field distribution is discussed for Co-basedamorphous ribbon annealed under different field conditions leading todifferent induced anisotropies: longitudinal field (LF) and transversal field(TF) annealing. In order to understand the relation between the fieldannealing-induced anisotropy and the performance of meander-core orthogonalfluxgate sensor, field-annealed ribbons with different in-plane anisotropiesas cores of orthogonal fluxgate sensors are employed and both noise andsensitivity in fundamental mode are measured. Experimental results indicatethat LF annealing-induced anisotropy with easy axis perpendicular to thedirection of excitation field can effectively improve the sensor sensitivity. Onthe other hand, TF annealing-induced anisotropy with easy axis parallel toexcitation field results in lower sensitivity, but the noise is also lower. Theresults obtained are useful for developing the high-performance orthogonalfluxgate sensors based on amorphous ribbon cores.
机译:讨论了在不同的磁场条件下退火的Co基 r 非晶带的磁各向异性场分布,导致不同的感应各向异性:纵向场(LF)和横向场 r n(TF)退火。为了理解磁场 r 退火引起的各向异性与曲核正交 r nfluxgate传感器的性能之间的关系,正交磁通门传感器具有不同平面内各向异性 r nas磁芯的场退火带为使用并测量基本模式下的噪声和灵敏度。实验结果表明,LF退火诱导的各向异性具有易于与激发场方向垂直的轴,可以有效地提高传感器的灵敏度。另一方面,TF退火引起的各向异性(易轴平行于xe场)导致灵敏度较低,但噪声也较低。获得的结果对于开发基于非晶带状磁芯的高性能正交感应门传感器很有用。

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  • 来源
    《Physica status solidi 》 |2018年第21期| 1800400.1-1800400.6| 共6页
  • 作者单位

    Key Laboratory of Thin Film and Microfabrication (Ministry ofEducation)Department of Micro-Nano ElectronicsSchool of Electronic Information and Electrical EngineeringShanghai Jiao Tong UniversityDongchuan Road 800, Shanghai 200240, China;

    Key Laboratory of Thin Film and Microfabrication (Ministry ofEducation)Department of Micro-Nano ElectronicsSchool of Electronic Information and Electrical EngineeringShanghai Jiao Tong UniversityDongchuan Road 800, Shanghai 200240, China;

    Department of Magnetism and Magnetic NanomaterialsUral Federal University620002 Ekaterinburg, Russia;

    Key Laboratory of Thin Film and Microfabrication (Ministry ofEducation)Department of Micro-Nano ElectronicsSchool of Electronic Information and Electrical EngineeringShanghai Jiao Tong UniversityDongchuan Road 800, Shanghai 200240, China;

    Key Laboratory of Thin Film and Microfabrication (Ministry ofEducation)Department of Micro-Nano ElectronicsSchool of Electronic Information and Electrical EngineeringShanghai Jiao Tong UniversityDongchuan Road 800, Shanghai 200240, China;

    Key Laboratory of Thin Film and Microfabrication (Ministry ofEducation)Department of Micro-Nano ElectronicsSchool of Electronic Information and Electrical EngineeringShanghai Jiao Tong UniversityDongchuan Road 800, Shanghai 200240, China;

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  • 正文语种 eng
  • 中图分类
  • 关键词

    amorphous ribbon; field annealing; induced anisotropy; meander-core; orthogonal fluxgate;

    机译:非晶带场退火诱发各向异性曲核正交磁通门;

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