Support vector machine-based image classification for genetic syndrome diagnosis

摘要

We implement structural risk minimization and cross-validation in order to optimize kernel and parameters of a support vector machine (SVM) and multiclass SVM-based image classifiers, thereby enabling the diagnosis of genetic abnormalities. By thresholding the distance of patterns from the hypothesis separating the classes we reject a percentage of the miss-classified patterns reducing the expected risk. Accurate performance of the SVM in comparison to other state-of-the-art classifiers demonstrates the benefit of SVM-based genetic syndrome diagnosis.