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overlay striping and optimal parallel I/O for modern applications

机译:适用于现代应用的覆盖条带化和最佳并行I / O

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Disk array systems are rapidly becoming the secondary-storage media of choice for many emerging applications with large storage and high bandwidth requirements. Striping data across the disks of a disk array introduces significant performance benefits mainly because the effective transfer rate of the secondary storage is increased by a factor equal to the stripe width. However, the choice of the optimal stripe width is an open problem: no general formal analysis has been reported and intuition alone fails to provide good guidelines. As a result one may find occasionally contradictory recommendations in the literature. With this work we first contribute an analytical calculation of the optimal stripe width. Second, we recognize that the optimal stripe width is sensitive to the multiprogramming level, which is not known a priori and fluctuates with time. Thus, calculations of the optimal stripe width are, by themselves only. of little practical use. For this reason we propose a novel striping technique, called overlay striping, which allows objects to be retrieved using a number of alternative stripe widths. We provide the detailed algorithms for our overlay striping method and we study the associated storage overhead and performance improvements and we show that we can achieve near optimal performance for very wide ranges of the possible multiprogramming levels, while incurring small storage overheads.
机译:磁盘阵列系统正迅速成为许多具有大存储量和高带宽要求的新兴应用的首选辅助存储介质。跨磁盘阵列的磁盘条带化数据带来了显着的性能优势,这主要是因为辅助存储的有效传输速率增加了与条带宽度相等的因数。然而,最佳条纹宽度的选择是一个未解决的问题:尚无一般形式分析的报道,仅凭直觉就无法提供良好的指导原则。结果,人们有时会在文献中发现相互矛盾的建议。通过这项工作,我们首先为最佳条纹宽度的解析计算做出了贡献。其次,我们认识到最佳的条带宽度对多重编程水平敏感,这是先验未知的,并且会随时间波动。因此,最佳条带宽度的计算仅靠它们自己。几乎没有实际用途。因此,我们提出了一种新颖的条纹技术,称为叠加条纹技术,该技术允许使用多种替代条纹宽度来检索对象。我们为覆盖条带化方法提供了详细的算法,并且研究了相关的存储开销和性能改进,并且表明在很大范围的可能的多重编程级别上,我们可以实现接近最佳的性能,同时又会产生较小的存储开销。

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