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Investigation of turn-on voltage shift in organic ferroelectric transistor with high polarity gate dielectric

机译:具有高极性栅极电介质的有机铁电晶体管中导通电压偏移的研究

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Large positive shifts of turn-on voltage V_(to) were observed in ferroelectric organic thin film transistor using P(VDF-TrFE) copolymer (57-43 mol%) as gate insulator during OFF to ON state sweeping. The shift of the transfer characteristic up to +25 V is attributed to the accumulation of mobile charge carriers (holes) in pentacene layer even during the device OFF state. The observed phenomena were first discussed on the basis of a negative surface potential created by the dipole field of a polar dielectric and trap states in an organic semiconductor layer. It was however found that these were unable to fully address the observed strong V_(to) shift due to the presence of large polarization in the P(VDF-TrFE) layer. A mechanism of negative polarization-compensating charges which are injected to the insulator region next to the semiconductor layer was proposed and examined to understand the phenomenon. The turn-on voltage is found to change with different magnitude of positive voltage pulses, and corresponds to different amount of charges injected for compensation. Time measurement of drain current shows a transient decaying behavior when gate bias is switched from positive to negative polarity which confirms the trapping of negative charges in the insulator.
机译:在使用P(VDF-TrFE)共聚物(57-43 mol%)作为栅极绝缘体的铁电有机薄膜晶体管中,在从关到开状态扫描期间,观察到导通电压V_(to)的大正移。甚至在器件关闭状态期间,转移特性的最高偏移量为+25 V仍归因于并五苯层中移动电荷载流子(空穴)的积累。首先根据由极性介电质的偶极场和有机半导体层中的陷阱态产生的负表面电势来讨论观察到的现象。然而,发现由于在P(VDF-TrFE)层中存在大极化,这些不能完全解决观察到的强V_to移动。提出并研究了注入负电荷的负极化补偿机制,该负极化补偿电荷被注入到与半导体层相邻的绝缘体区域中。发现导通电压随着正电压脉冲的大小不同而变化,并且对应于为补偿而注入的不同电荷量。当栅极偏置从正极性切换为负极性时,漏极电流的时间测量显示出瞬态衰减行为,这证实了绝缘体中存在负电荷。

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