Accelerated lifetime test based on general electrical principles for light-emitting electrochemical cells

摘要

We report the use of a straightforward alternative accelerated lifetime test (ALT) method, derived from general electrical principles, for estimating how encapsulated light-emitting electrochemical cells (LECs) operate in ambient conditions. The LECs that we tested were made with poly(2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylenevinylene) (MEH-PPV), poly(ethylene oxide) (PEO), tri-fluoromethanesulfonate (KCF_3SO_3) and PEDOT:PSS. These LECs were fabricated by using a common method that is described in published investigations of operational lifetime. The method we developed used only a single data point originating from a high level of current density, and could predict the operational lifetimes of the encapsulated LECs to within a margin of error of less than 4% in this system.