Opto-electronic displacement gauge based on speckle interferometer

摘要

Modern technology demands precise distance measurements. People have used many phenomena for this purpose but there is always a need for less expensive and more reliable devices. In this paper we present a simple opto-electronic distance measurement gauge based on the phenomenon of speckling phenomenon. In the proposed setup we substitute diffraction gratings, which are commonly used in displacement gauges, with a rough surface. When illuminated by a coherent and monochromatic beam the surface scatters light to form a speckle field, whose intensity variations are read by one or more detectors. These changes are related to displacement of the rough surface and , therefore, can be utilized for displacement measurements. The presented setup has some important advantages over the grating approach: lower mechanical tolerances on parts and being based directly on the wavelength of light instead of the period of a grating. Also, it is less expensive, so can offer a viable solution for medium accuracy distance measurements.