A novel interferometric method for contour mapping of optically rough surfaces

摘要

A new white light interferometric arrangement for contour mapping of light diffusing but not depolarising surfaces is presented and compared with related electronic speckle and holographic interferometry (ESPI and HI) methods. Using two angles of illumination of the tested surface, and modifying the light beam in the observation pupil it is possible to observe contour fringes with arbitrary sensitivity depending on the geometry of a chosen set-up.