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Self-reduction process of Eu~(3+) to Eu~(2+) in Eu-doped SrLaMgTaO_6 double perovskite thin films and its photoluminescence properties

机译:Eu-掺杂Srlamgtao_6双钙钛矿薄膜的Eu〜(3+)对Eu〜(2+)的自我还原过程及其光致发光性能

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This paper describes the novel fabrication of Eu3+-doped SrLaMgTaO6 (SLMTOE) thin films on a SrTiO3 (100) substrate using pulsed laser deposition (PLD) and an investigation of the dependence of their structural and photoluminescence (PL) properties on the partial pressure of oxygen. SLMTOE red phosphor has been vigorously studied in recent years because of its high efficiency compared to that of commercial red phosphor. However, the PL properties of thin films of this phosphor have not yet been reported. Our results indicate that SLMTOE grown at 100 mTorr produces the brightest red emission. A study of this sample also showed that the PL intensity at low partial pressure (10-100 mTorr) differed from that at high partial pressure (100-200 mTorr). X-ray photoelectron spectroscopy (XPS) analysis indicated that the enhanced PL intensity at low partial pressures is associated with defects in the thin film lattice, and the weakened PL intensity at high partial pressures can be related to the change in the ratio of Eu3+ to Eu2+ as a consequence of self-reduction. Our XPS result implies that the change of A site doped with Eu3+ ion is correlated significantly with the PL properties of double-perovskite thin films.
机译:本文描述了使用脉冲激光沉积(PLD)在SRTIO3(100)衬底上的EU3 +掺杂的SrlamgTaO6(SLMToE)薄膜的新颖制造,以及它们结构和光致发光(PL)性质在部分压力下的依赖性的研究氧。与商用红磷相比,近年来,近年来,SLMTOE红磷已经剧烈研究。然而,尚未报道该磷光体的薄膜的PL性能。我们的结果表明,在100 mtorr处生长的SLMTOE产生最亮的红色发射。该样品的研究还表明,低分压(10-100mTorr)下的PL强度与高部分压力(100-200 mTorr)不同。 X射线光电子体光谱(XPS)分析表明,低部分压力下的增强型PL强度与薄膜晶格中的缺陷相关,并且在高部分压力下的弱化PL强度可以与EU3 +比率的变化有关。 eu2 +由于自我减少。我们的XPS结果意味着掺杂有EU3 +离子的网站的变化与双钙钛矿薄膜的PL性能显着相关。

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