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Optical properties of amorphous Ge_(20)Se_(80) and Ag_6(Ge_(0.20)Se_(0.80))_(94) thin films

机译:非晶Ge_(20)Se_(80)和Ag_6(Ge_(0.20)Se_(0.80))_(94)薄膜的光学性质

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Thin films of chemical composition Ge_(20)Se_(80) and Ag_6(Ge_(0.20)Se_(0.80))_(94) are prepared by thermal evaporation technique. The optical properties of these thin films are determined by a method, based only on the transmission spectra at normal incidence, measured over the 400-2000 nm spectral range. This useful optical method takes into consideration the non-uniform thickness of thermally evaporated thin films. The dispersion of refractive index is discussed in terms of the single-oscillator Wemple and DiDomenico model. The optical absorption edge is described using the non-direct transition model proposed by Tauc and the optical band gap (E_g~(opt)) is calculated from the absorption coefficient (α) by Tauc's extrapolation procedure. It has been found that the value of refractive index (n) and oscillator strength (E_d) increase while average energy gap (E_0) and (E_g~(opt)) decrease after Ag incorporation. The decrease of (E_g~(opt)) has been explained on the basis of difference on the binding energies of different bonds which are arising due to the incorporation of Ag into a-Ge_(20)Se_(80) thin films.
机译:通过热蒸发技术制备化学成分为Ge_(20)Se_(80)和Ag_6(Ge_(0.20)Se_(0.80))_(94)的薄膜。这些薄膜的光学性质仅通过法线入射法在400-2000 nm光谱范围内测得的透射光谱来确定。这种有用的光学方法考虑了热蒸发薄膜的厚度不均匀。根据单振荡器Wemple和DiDomenico模型讨论了折射率的色散。使用Tauc提出的非直接过渡模型描述光吸收边缘,并通过Tauc的外推程序从吸收系数(α)计算出光学带隙(E_g〜(opt))。已经发现,掺入Ag后,折射率(n)的值和振荡器强度(E_d)的值增加,而平均能隙(E_0)和(E_g_(opt))减小。 (E_g〜(opt))的减少是基于不同的键的结合能的差异来解释的,这是由于将Ag掺入a-Ge_(20)Se_(80)薄膜中而引起的。

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