Phase unwrapping for fringe projection three-dimensional measurement with projector defocusing

摘要

For high-speed three-dimensional shape measurement, techniques with projector defocusing have become increasingly important. When the projector is defocused, structured patterns used for phase unwrapping are blurred. These blurred patterns need to be normalized into binary distributions in actual measurement. We propose a method to normalize these blurred structured patterns. The retrieved absolute phase is correct even when the measured objects contain discontinuous parts or contrasting colors.