Epithermal Inverse Kinetic Measurements and Their Interpretation Using a Two-Group Point-Kinetic Model

摘要

Two of the methods that can be used for the measurement of the subcriticality of a multiplying system are the inverse kinetic (IK) and the pulsed neutron source (PNS) techniques. These methods depend considerably on correction factors and/or kinetic parameters, which usually need to be caluclated using the same neutronic codes as those being validated via the experiments. The use of epithermal deteectors to reduce the dependence of area-raito PNS measurements on calculated correction factors was reported previously. In the current work, for the first time, epithermal detectors have been used for IK measurements.