Ion and X-ray micro-beam induced charge collection and their applications in CVD diamond detector characterisation

摘要

We have used a micrometer size X-ray beam generated from a synchrotron light source at the European Synchrotron Radiation Facility (ESRF) in Grenoble and a 2 MeV proton micro-beam at the Italian National Laboratory (LNL) of Legnaro to image the electronic transport properties of a CVD diamond detector developed within the CERN RD42 collaboration. The focused X-rays or protons are scanned over the device surface, and the induced current or charge pulse is measured and plotted on two dimensional maps. Due to the polycrystalline nature of the material, the maps are not homogeneous and both the techniques show structures ascribable to diamond grains. It was found that the uniformity of the maps depends on the lateral scale (binning) and on the analytical depth of the micro-probes.