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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms >NMR measurements of residual dipolar couplings for lifetime assessments in γ-irradiated silica-PDMS composite materials
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NMR measurements of residual dipolar couplings for lifetime assessments in γ-irradiated silica-PDMS composite materials

机译:残留偶极耦合的NMR测量用于评估γ辐照的二氧化硅-PDMS复合材料的寿命

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摘要

We have measured changes in ~1H NMR residual dipolar couplings, <Ω_d~2>, and the mean squared fluctuations in the residual dipolar couplings, (δΩ_d~2), associated with cross-link density changes in a complex silica-filled PDPS/PDMS block copolymer composite material. The cross-links were induced by exposure of the composite material to γ-radiation from a Co-60 source. We have detected ~1H NMR responses from polymer chains directly interacting with the silica and network polymer chains not directly interacting with the silica. The residual dipolar couplings change in a straightforward manner with radiation and chemically induced cross-linking of the polymer network. The strength of the filler-polymer interaction was seen to affect only the residual dipolar couplings and the transverse relaxation times and not directly the mean squared fluctuations of the residual dipolar couplings. Dipolar correlation effect NMR shows direct evidence for surface adsorbed species, however, and has measured changes in the amount of surface adsorption due to irradiation. The results suggest that siloxane polymer cross-linking was preceded by an initial disruption of the hydrogen bond interaction between the polymer backbone and the silica silanol groups at the polymer/silica interface and that noticeable radiation induced cross-linking then occurs at dosages above 100 kGray.
机译:我们测量了〜1H NMR残留偶极耦合的变化<Ω_d〜2>,以及残留偶极耦合的均方差(δΩ_d〜2),这与复杂的填充二氧化硅的PDPS /中的交联密度变化有关。 PDMS嵌段共聚物复合材料。交联是通过将复合材料暴露于来自Co-60源的γ射线引起的。我们已经检测到直接与二氧化硅相互作用的聚合物链和未与二氧化硅直接相互作用的网络聚合物链的〜1 H NMR反应。残留的偶极偶合随着聚合物网络的辐射和化学诱导的交联以直接的方式改变。看到填料-聚合物相互作用的强度仅影响残余的偶极耦合和横向弛豫时间,而不直接影响残余的偶极耦合的均方波动。偶极相关效应NMR显示了表面吸附物质的直接证据,但是已经测量了由于辐射引起的表面吸附量的变化。结果表明,在硅氧烷聚合物交联之前,聚合物主链与聚合物/二氧化硅界面处的硅硅烷醇基团之间的氢键相互作用最初受到破坏,然后在高于100 kGray的剂量下发生明显的辐射诱导的交联。 。

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