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TMR effects of sputtered Fe-Al-O granular films after irradiation by high energy ions

机译:高能离子辐照后溅射Fe-Al-O颗粒薄膜的TMR效应

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Fe-Al-O granular films prepared by rf-sputtering were irradiated at room temperature with 1.8 and 2.8 MeV C ions and 2.8 MeV Ge ions to investigate the effects of irradiation-induced defects to the microscopic structure in the film and also the magnetic properties. Using conversion electron Mossbauer spectroscopy, it is observed that the dispersed state of nanosized iron particles is significantly affected by the irradiation at a dose range of 10~(15)-10~(16) ions/cm~2, and that the change in the dispersion results in a decrease of the magnetoresistance ratio. The results suggest that the aggregation of iron particles is promoted by the irradiation.
机译:在室温下用1.8和2.8 MeV C离子和2.8 MeV Ge离子对通过射频溅射制备的Fe-Al-O颗粒薄膜进行辐照,以研究辐照引起的缺陷对薄膜微观结构以及磁性能的影响。 。使用转换电子Mossbauer光谱,可以观察到在10〜(15)-10〜(16)离子/ cm〜2的剂量范围内,辐照对纳米铁颗粒的分散状态有显着影响,并且其变化分散导致磁阻比降低。结果表明,辐射促进了铁颗粒的聚集。

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