Complementary use of PIXE-alpha and XRF portable systems for the non-destructive and in situ characterization of gemstones in museums

摘要

Gemstones on gold Hellenistic (late 4th century BC, 1st AD) jewelry, exhibited at the Benaki Museum of Athens, were analyzed in situ by means of two non-destructive and portable analytical techniques. The composition of major and minor elements was determined using a new portable PIXE-alpha spectrometer. The analytical features of this spectrometer allow the determination of matrix elements from Na to Zn through the K-lines and the determination of higher atomic number elements via the L- or M-lines. The red stones analyzed were revealed as red garnets, displaying a compositional range from Mg-rich garnet to Fe-rich garnet. The complementary use of a portable XRF spectrometer provided additional information on some trace elements (Cr and Y), which are considered to be important for the chemical separation between different garnet groups. A comparison of our results with recent literature data offers useful indications about the possible geographical provenance of the stones. The analytical techniques, their complementarity and the results obtained are presented and discussed.