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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research >Negative ions, energy loss, and electron emission during grazing scattering of fast H and He atoms from a clean and oxidized NiAl(l 1 0) surface
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Negative ions, energy loss, and electron emission during grazing scattering of fast H and He atoms from a clean and oxidized NiAl(l 1 0) surface

机译:从清洁和氧化的NiAl(l 1 0)表面掠过快速H和He原子的掠射散射过程中的负离子,能量损失和电子发射

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摘要

Negative ion fractions, projectile energy loss, and the emission of electrons is studied for grazing scattering of hydrogen and helium atoms/ions from a clean and oxidized NiAl(l 1 0) surface. Making use of translation energy spectroscopy and the coincident detection of the number of emitted electrons we have studied the electronic interaction mechanisms for the change from a clean metal target to an insulator surface via the preparation of a well defined ultrathin alumina film on top of the metal substrate. We find that already for a monolayer thick oxide film the characteristic different features of electronic processes for the surface of an insulator crystal are present.
机译:研究了负离子分数,射弹能量损失和电子发射,以便从干净和氧化的NiAl(l 1 0)表面掠过氢和氦原子/离子的掠射散射。利用平移能谱和同时检测发射的电子数量,我们研究了通过在金属顶部制备清晰定义的超薄氧化铝膜来实现从干净金属靶到绝缘体表面的电子相互作用机理。基质。我们发现,对于单层厚氧化膜而言,已经存在绝缘体晶体表面的电子工艺的不同特征。

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