Introduction: Special issue of Proceedings of the '1st International Conference on Tomography of Materials and Structures', 1-5 July 2013, Ghent, Belgium, ('ICTMS2013')

摘要

Computed tomography (CT) has been applied for many years in a wide range of research domains, including material sciences, geo-sciences as well as industrial applications. The last two decades, X-ray computed tomography as well as neutron computed tomography, has been developing at a high speed both on the hardware and the software side (e.g. ).