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Swift heavy ion irradiated spinel ferrite: A cheap radiation resistant material

机译:快速重离子辐照尖晶石铁氧体:一种廉价的抗辐射材料

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Effect of (80 MeV) ~(16)O 6~+ ion irradiation on the structural properties and cation distribution of the as-burnt samples (i.e. the samples are without any thermal/sintering treatment) with the following compositions: MnFe_2O_4, Mn_(0.5)Zn_(0.5)Fe_2O_4 and ZnFe_2O_4 prepared by sol-gel auto-combustion technique have been studied through in-situ and ex-situ X-ray diffraction (XRD) technique. Well characterized single phase MnFe_2O_4 and Mn_(0.5)Zn_(0.5)Fe_2O_4 samples were irradiated at fluence 1 × 10~(11), 1 × 10~(12), 1 × 10~(13) and 1 × 10~(14) ions/cm~2 to see the effect of the electronic energy loss induced changes in the structural properties and in cation distribution monitored through ex-situ XRD. ZnFe_2O_4 samples were irradiated with ion fluence values ranging between 1 × 10~(11) -2 × 10~(14) ions/cm~2 to observe the effect of in-situ XRD on structural properties and cation distribution. Results very clearly depict the redistribution of cations in the samples, which show noticeable changes in: ionic radii of A-site (r_A) and B-site (r_B), experimental and theoretical lattice parameter (a_(exp.), a_(th.)), unit cell volume (V), Scherrer's Grain diameter (D), oxygen positional parameter (u), tetrahedral and octahedral bond length (R_A, R_B), shared tetrahedral and octahedral edge (d_(AE), d_(BE)) and bond angles (θ_1, θ_2, θ_3, θ_4, θ_5). Results are interpreted in terms of irradiation induced changes in the above mentioned parameters.
机译:(80 MeV)〜(16)O 6〜+离子辐照对以下组成的烧成样品(即未经任何热处理/烧结处理)的结构性能和阳离子分布的影响:MnFe_2O_4,Mn_(通过原位和非原位X射线衍射(XRD)技术研究了溶胶-凝胶自燃技术制备的0.5)Zn_(0.5)Fe_2O_4和ZnFe_2O_4。表征良好的单相MnFe_2O_4和Mn_(0.5)Zn_(0.5)Fe_2O_4样品以注量1×10〜(11),1×10〜(12),1×10〜(13)和1×10〜(14)辐照离子/ cm〜2来观察电子能量损失对通过异位XRD监测的结构性质和阳离子分布变化的影响。 ZnFe_2O_4样品的离子通量值范围为1×10〜(11)-2×10〜(14)离子/ cm〜2,以观察原位XRD对结构性能和阳离子分布的影响。结果非常清楚地描述了样品中阳离子的重新分布,显示出以下方面的显着变化:A位置(r_A)和B位置(r_B)的离子半径,实验和理论晶格参数(a_(exp。),a_(th 。)),晶胞体积(V),Scherrer晶粒直径(D),氧位置参数(u),四面体和八面体键长(R_A,R_B),共享的四面体和八面体边(d_(AE),d_(BE ))和键角(θ_1,θ_2,θ_3,θ_4,θ_5)。根据辐照引起的上述参数变化来解释结果。

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