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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms >Background-free beta-decay half-life measurements by in-trap decay and high-resolution MR-ToF mass analysis
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Background-free beta-decay half-life measurements by in-trap decay and high-resolution MR-ToF mass analysis

机译:通过陷内衰减和高分辨率MR-ToF质谱分析进行无背景的β衰变半衰期测量

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摘要

In-trap decay in ISOLTRAP's radiofrequency quadrupole (RFQ) ion beam cooler and buncher was used to determine the lifetime of short-lived nuclides. After various storage times, the remaining mother nuclides were mass separated from accompanying isobaric contaminations by the multi-reflection time-of-flight mass separator (MR-ToF MS), allowing for a background-free ion counting. A feasibility study with several online measurements shows that the applications of the ISOLTRAP setup can be further extended by exploiting the high resolving power of the MR-ToF MS in combination with in-trap decay and single-ion counting.
机译:ISOLTRAP的射频四极杆(RFQ)离子束冷却器和聚束器中的阱内衰减用于确定短寿命核素的寿命。经过各种存储时间后,通过多反射飞行时间质量分离器(MR-ToF MS)将剩余的母核素与伴随的同量异位杂质进行质量分离,从而实现了无背景离子计数。一项具有若干在线测量结果的可行性研究表明,通过利用MR-ToF MS的高分辨能力与阱内衰减和单离子计数相结合,可以进一步扩展ISOLTRAP设置的应用。

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