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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research >Low energy carbon ion induced M X-ray relative intensities for _(70)Yb, _(82)Pb and _(83)Bi
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Low energy carbon ion induced M X-ray relative intensities for _(70)Yb, _(82)Pb and _(83)Bi

机译:_(70)Yb,_(82)Pb和_(83)Bi的低能碳离子诱导的M X射线相对强度

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摘要

In the present work, the intensity ratios, I-Mk/I-Mn (exp) (k = xi, beta, gamma, m(1); n = alpha beta, alpha), for Yb-70, Pb-82 and( 83)Bi induced by the Cq+ (q = 4, 5) ions having energies in the range 800-1500 keV have been measured. These intensity ratios have been compared with those calculated using the ECPSSR model based carbon ion induced M-j (j = 1-5) sub-shell ionization cross sections, the X-ray emission rates based on the Dirac-Fock (DF) model, two sets of the fluorescence and Coster-Kronig yields based on the non-relativistic Hermann-Skillman potential calculations and those based on the relativistic Dirac-Hartree-Slater model. Significant differences observed between the present measured and calculated ratios could be due to multiple-ionization induced in the investigated elements by the incident carbon ions.
机译:在本工作中,Yb-70,Pb-82和Ib的强度比I-Mk / I-Mn(exp)(k = xi,beta,γ,m(1); n = alpha beta,alpha)。 (83)测量了由能量在800-1500 keV范围内的Cq +(q = 4,5)离子诱导的Bi。这些强度比已经与使用基于ECPSSR模型的碳离子诱导的Mj(j = 1-5)子壳电离截面,基于Dirac-Fock(DF)模型的X射线发射率,两个基于非相对论的Hermann-Skillman势能计算和基于相对论的Dirac-Hartree-Slater模型的荧光和Coster-Kronig收益集。当前测得的比率和计算的比率之间观察到的显着差异可能是由于入射的碳离子在被研究元素中引起的多次电离。

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