Measurement of an electron-beam size with a beam profile monitor using Fresnel zone plates

摘要

We present a non-destructive and real-time beam profile monitor using Fresnel zone plates (FZPs) and the measurement of an electron-beam size with this monitor in the KEK―Accelerator Test F'acility (ATF) damping ring. The monitor system has the structure of a long-distance X-ray microscope, where two FZPs constitute an X-ray imaging optics. The synchrotron radiation from the electron beam at the bending magnet is monochromatized by a crystal monochromator and the transverse electron beam image is twenty times magnified by the two FZPs and detected on an X-ray CCD camera. The expected spatial resolution for the selected photon energy of 3.235keV is sufficiently high to measure the horizontal and vertical beam sizes of the ATF damping ring. With the beam profile monitor, we succeeded in obtaining a clear electron-beam image and measuring the extremely small beam size less than 10 μm. The measured magnification of the X-ray imaging optics in the monitor system was in good agreement with the design value.