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Random telegraph signals in charge coupled devices

机译:电荷耦合设备中的随机电报信号

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摘要

An investigation of fluctuating pixels resulting from proton irradiation of an E2V Technologies CCD47-20 device is presented. The device structure, experimental set up and irradiation methodology are described, followed by a detailed analysis of radiation induced random telegraph signals, RTS. The characteristics of the observed flickering pixels are discussed in detail and the proposed models explaining the mechanism behind the phenomena are viewed in light of the collected data.
机译:提出了对E2V Technologies CCD47-20器件的质子辐照导致的像素波动的研究。描述了设备的结构,实验设置和辐照方法,然后详细分析了辐射诱发的随机电报信号RTS。详细讨论了观察到的闪烁像素的特性,并根据收集的数据查看了解释现象背后机理的提议模型。

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