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Noise of the induced signal pulses in semiconductor drift detectors

机译:半导体漂移检测器中感应信号脉冲的噪声

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摘要

The noise associated with the signal current at the anode of a semiconductor drift detector is evaluated when the electrostatic induction giving rise to the signal is fully taken into account and the correct boundary condition at the anode for the electron density is considered. The consequent signal-to-noise ratio for both time and amplitude measurements is calculated as a function of the filter width and compared with previous results based on more simplified treatments.
机译:当充分考虑到会引起信号的静电感应并考虑阳极上电子密度的正确边界条件时,会评估与半导体漂移检测器阳极处的信号电流相关的噪声。随后计算出的时间和幅度测量的信噪比是滤波器宽度的函数,并与基于更简化处理的先前结果进行比较。

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