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Fast triggering in silicon drift detectors by means of holes' induction

机译:通过空穴感应在硅漂移检测器中快速触发

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摘要

The signal induced by electrons and holes on the p~+ strips close to the interaction point can provide a very precise time mark of the photon interaction in a Silicon Drift Detector (SDD). A detailed study of the shape of the induced signals and of the parameters affecting the achievable time resolution is presented together with the first experimental tests on a linear SDD. The measured time resolution of the trigger signal is 1.5 ns r.m.s.. Such a fast trigger makes possible the use of SDDs as high resolution X-ray imagers and opens to the development of novel Compton telescopes for γ-ray imaging based on Controlled Drift Detectors.
机译:由p〜+条带上靠近相互作用点的电子和空穴感应的信号可以为硅漂移检测器(SDD)中的光子相互作用提供非常精确的时间标记。与线性SDD的首次实验测试一起,对感应信号的形状和影响可达到的时间分辨率的参数进行了详细研究。测得的触发信号的时间分辨率为1.5 ns r.m.s.。这种快速触发使得可以将SDD用作高分辨率X射线成像仪,并为基于可控漂移检测器的新型康普顿望远镜进行γ射线成像开辟了道路。

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