Registration and measurement of deformation reorientation in natural diamond lattice by the synchrotron Laue-SR method

摘要

Under mechanical impact, several kinds of lattice defects are known to arise during plastic deformation (PD). In all crystals, the deformation processes occur such as complex sliding, mechanical kink, irregular reorientation, polygonization, and their variations. These mechanical defects can usually be successfully studied in experiments on model crystals. However, experiments on the deformation of diamond crystal using the simulation of natural processes are hampered due to peculiar extreme properties of diamond. Here, nature itself helps us. When examining natural diamonds and their internal substructure, one can observe mechanical defects (and actually they have been revealed already) similar to those studied in other model crystals. In this work, a directly detected defect in diamond, belonging to widely known mechanical defects of the reorientation type, is described for the first time. On the Laue-SR topograms, these defects, if in the position of reflectance, are shown by parallel strokes. One can find the orientation for a sample, when these reoriented crystal interlayers are beyond the contrast, and the main crystal, on the contrary, is in the position of reflectance. Then, the topogram looks as a black field with white empty spaces.