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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment >Characterization of large volume HPGe detectors. Part Ⅰ: Electron and hole mobility parameterization
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Characterization of large volume HPGe detectors. Part Ⅰ: Electron and hole mobility parameterization

机译:大容量HPGe检测器的表征。第一部分:电子和空穴迁移率参数化

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An analytical model for the hole mobility in a Ge crystal lattice was developed to describe the hole drift anisotropy with experimental velocity values along the crystal axis as parameters. The new model is based on the drifted Maxwellian hole distribution in Ge. It is verified by reproducing experimental longitudinal hole anisotropy data with high accuracy. A comparison between electron and hole mobility shows large differences for the longitudinal and tangential velocity anisotropy as a function of the electrical field orientation with respect to the crystal orientation. The anisotropic mobility causes measurable differences on rise times and pulse shapes which vary with the location where the charge carriers are created in the Ge crystal. These effects are relevant for position determination and γ-ray tracking.
机译:建立了Ge晶格中空穴迁移率的分析模型,以沿晶体轴的实验速度值作为参数来描述空穴漂移各向异性。新模型基于Ge中的漂移Maxwellian孔分布。通过高精度再现实验纵向孔各向异性数据进行了验证。电子和空穴迁移率之间的比较显示出纵向和切向速度各向异性的大差异,该各向异性是相对于晶体取向的电场取向的函数。各向异性迁移率会导致上升时间和脉冲形状的可测量差异,这些差异会随Ge晶体中载流子的产生位置而变化。这些影响与位置确定和γ射线跟踪有关。

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