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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research >Ultimate limits for the radiation hardness of silicon strip detectors for sLHC
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Ultimate limits for the radiation hardness of silicon strip detectors for sLHC

机译:sLHC硅条探测器的辐射硬度极限

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The new SuperLHC upgrade will impose severe restrictions on the radiation hardness of silicon detectors since a maximum fluence of 10~(16) particles/cm~2 is foreseen in the innermost region. Microstrip detectors have been fabricated in p-type high resistivity float zone silicon at CNM facilities, been irradiated at the TRIGA reactor in Ljubljana to a fluence of 10~(16) neutrons/cm~2 and characterized at IFIC laboratory. The total collected charge before and after irradiation in the detectors has been measured by ~(90)Sr beta source and by infrared laser illumination. The results show that even after this extreme radiation fluence, p-type substrate detectors collect 3500 electrons when biased at 800 V, which is enough charge to induce a measurable signal with standard readout electronics. P-type strip detectors could be suitable for the middle and even inner regions of sLHC.
机译:新的SuperLHC升级将对硅探测器的辐射硬度施加严格的限制,因为在最内部区域预计最大通量为10〜(16)个粒子/ cm〜2。微带检测器是在CNM设施的p型高电阻浮区硅中制造的,并在卢布尔雅那的TRIGA反应堆中辐照至10〜(16)中子/ cm〜2的通量,并在IFIC实验室进行了表征。通过〜(90)Srβ光源和红外激光照射,测量了探测器在辐照之前和之后收集的总电荷。结果表明,即使经过这种极端的辐射通量,p型衬底检测器在偏置为800 V时也会收集3500个电子,这足以用标准的读出电子设备感应出可测量的信号。 P型条形检测器可能适用于sLHC的中间甚至内部区域。

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