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Hard X-ray detection with a gallium phosphide Schottky diode

机译:用磷化镓肖特基二极管进行硬X射线检测

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摘要

We report on the detection of hard X-rays using a GaP Schottky diode at the HASYLAB synchrotron radiation research facility. Exposure to alpha particles from an ~(214)Am source showed that the device was spectroscopic at room temperature with a FWHM energy resolution of 3.5% at 5.5 MeV. It was also found to be responsive to X-rays in the range 11-100 keV. Although individual energies are not spectrally resolved there is a proportionality of response to increasing X-ray energy. A two-dimensional scan of the sensitive area using a 30 × 30 μm~2 30 keV pencil beam showed the spatial response of the detector to be uniform at the few percent level, consistent with statistics.
机译:我们报告了在HASYLAB同步加速器辐射研究设施中使用GaP肖特基二极管检测硬X射线的情况。暴露于〜(214)Am来源的α粒子表明,该装置在室温下具有光谱,在5.5 MeV下的FWHM能量分辨率为3.5%。还发现它对11-100 keV范围内的X射线有响应。尽管不能单独解析各个能量,但是对增加的X射线能量却有一定比例的响应。使用30×30μm〜2 30 keV铅笔束对敏感区域进行二维扫描,显示检测器的空间响应在百分之几的水平上是均匀的,与统计数据一致。

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