【24h】

Performance updating of CdZnTe strip-drift detectors

机译:CdZnTe带状漂移检测器的性能更新

获取原文
获取原文并翻译 | 示例

摘要

Efficiency of strip-drift structure of contacts for improvement of charge collection conditions in CdZnTe detectors was shown some years ago. For such detector with area 10 x 10 mm~2 and thickness 3 mm of crystal, produced by eV products we obtained energy resolution 1.9 and 12.0 keV on energies 59.6 and 662 keV correspondingly. Recently, significant progress was done in CdZnTe crystals growth technology. In the present paper we present preliminary result of performance updating of CdZnTe strip-drift detectors based on crystal of 10 x 10 x 6 mm~3 produced by Yinnel Tech company. Results of crystal input characterization, the value of leakage current and inter-strip resistivity for all strips and energy resolution for collecting strips of detector are presented. The energy resolutions 1.8 and 11.0 keV on energies 59.6 and 662 keV correspondingly were obtained although the thickness of detector was two times more than earlier.
机译:几年前,已经证明了接触带状漂移结构对于改善CdZnTe检测器中电荷收集条件的效率。对于由eV产品生产的面积为10 x 10 mm〜2且晶体厚度为3 mm的这种探测器,我们分别以59.6和662 keV的能量获得了1.9和12.0 keV的能量分辨率。最近,CdZnTe晶体生长技术取得了重大进展。在本文中,我们介绍了基于Innel技术公司生产的10 x 10 x 6 mm〜3晶体的CdZnTe带状漂移检测器性能更新的初步结果。给出了晶体输入表征结果,所有条带的泄漏电流值和条间电阻率以及收集探测器条带的能量分辨率。尽管检测器的厚度是早期的两倍,但分别获得了能量59.6和662 keV的能量分辨率1.8和11.0 keV。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号