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Possible use of CdTe detectors in kVp monitoring of diagnostic X-ray tubes

机译:在诊断X射线管的kVp监视中可能使用CdTe检测器

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It has been suggested that kVp of diagnostic X-ray devices (or maximal energy of X-ray photon spectra) should be monitored routinely; however a standardized non-invasive technique has yet to be developed and proposed. It is well known that the integral number of Compton scattered photons and the intensities of fluorescent X-ray lines registered after irradiation of some material by an X-ray beam are a function of the maximal beam energy. CdTe detectors have sufficient energy resolution to distinguish individual X-ray fluorescence lines and high efficiency for the photon energies in the diagnostic region. Our initial measurements have demonstrated that the different ratios of the integral number of Compton scattered photons and intensities of K and L fluorescent lines detected by CdTe detector are sensitive function of maximal photon energy and could be successfully applied for kVp monitoring.
机译:建议应定期监测诊断X射线设备的kVp(或X射线光子光谱的最大能量)。然而,尚未开发和提出标准化的非侵入性技术。众所周知,在某些材料被X射线束照射后,康普顿散射光子的整数数量和荧光X射线线的强度是最大束能量的函数。 CdTe检测器具有足够的能量分辨率,可以区分各个X射线荧光线,并具有很高的诊断区域光子能量效率。我们的初步测量表明,CdTe检测器检测到的康普顿散射光子积分数的不同比率以及K和L荧光线强度的不同是最大光子能量的敏感函数,可以成功地用于kVp监测。

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