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Tests of timing properties of silicon photomultipliers

机译:硅光电倍增管的定时特性测试

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摘要

Timing measurements of Silicon Photomultipliers (SiPM) [1,2] at the picosecond level were performed at Fermilab. The core timing resolution of the electronic measurement technique is approximately 2 ps. The single photoelectron time resolution (SPTR) was measured for the signals coming from the SiPM's. A SPTR of about one hundred picoseconds was obtained for SiPM's illuminated by laser pulses. The dependence of the SPTR on applied bias voltage and on the wavelength of the light was measured. A simple model is proposed to explain the difference in the SPTR for blue and red light. A time of flight system based on the SiPM's, with quartz Cherenkov radiators, was tested in a proton beam at Fermilab. The time resolution obtained is 35 ps per SiPM. Finally, requirements for the SiPM's temperature and bias voltage stability to maintain the time resolution are discussed.
机译:硅光电倍增管(SiPM)[1,2]在皮秒级的定时测量是在Fermilab进行的。电子测量技术的核心时序分辨率约为2 ps。测量来自SiPM的信号的单光电子时间分辨率(SPTR)。对于被激光脉冲照射的SiPM,获得了大约一百皮秒的SPTR。测量了SPTR对施加的偏压和光的波长的依赖性。提出了一个简单的模型来解释蓝光和红光在SPTR中的差异。在费米实验室的质子束中测试了基于SiPM的飞行时间系统以及石英Cherenkov散热器。获得的时间分辨率为每SiPM 35 ps。最后,讨论了保持时间分辨率对SiPM的温度和偏置电压稳定性的要求。

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  • 作者单位

    Fermi National Accelerator Laboratory, Batavia, IL 60510, USA;

    Fermi National Accelerator Laboratory, Batavia, IL 60510, USA;

    Argonne National Laboratory, Argonne, IL 60637, USA;

    Fermi National Accelerator Laboratory, Batavia, IL 60510, USA;

    Fermi National Accelerator Laboratory, Batavia, IL 60510, USA;

    Argonne National Laboratory, Argonne, IL 60637, USA;

    Fermi National Accelerator Laboratory, Batavia, IL 60510, USA;

    SLAC National Accelerator Laboratory, Stanford, CA, USA;

    University of Puerto Rico, Mayaguez, PR 00681, USA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    SiPm; photodetectors; TOF;

    机译:SiPm;光电探测器到F;

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